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Title:

Virtual Double Pulse Tests to Reduce Measuring Time and Effort in Semiconductor Loss Modeling

Document type:
Konferenzbeitrag
Author(s):
Goldmann, Daniel; Schramm, Simon; Galek, Marek; Herzog, Hans-Georg
Pages contribution:
1–7
Book / Congress title:
PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
Publisher:
VDE Verlag
Publisher address:
Berlin, Germany
Year:
2019
Year / month:
2019-05
Month:
May
Print-ISBN:
978-3-8007-4938-6
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