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Document type:
Konferenzbeitrag
Author(s):
Jaenichen, F.-M.; Liepold, C. J.; Ismail, A.; Schiffer, M.; Ehm, H.
Non-TUM Co-author(s):
ja
Cooperation:
national
Title:
Disruption Evaluation in End-to-End Semiconductor Supply Chains via Interpretable Machine Learning
Intellectual Contribution:
Contribution to Practice
Book / Congress title:
10th IFAC Conference on Manufacturing Modelling, Management and Control MIM 2022
Congress (additional information):
Nantes, France
Year:
2022
Month:
Jun
Fulltext / DOI:
doi:doi.org/10.1016/j.ifacol.2022.09.479
Key publication:
Nein
Peer reviewed:
Ja
International:
Ja
Commissioned:
not commissioned
Technology:
Ja
Interdisciplinarity:
Ja
Mission statement:
;
Ethics and Sustainability:
Nein
BibTeX
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mediaTUM Gesamtbestand
Einrichtungen
Schools
TUM School of Management
Departments
Operations and Technology
Professur für Business Analytics and Intelligent Systems (Prof. Schiffer)
Conferences
mediaTUM Gesamtbestand
Hochschulbibliographie
2022
Schools und Fakultäten
TUM School of Management
Professur für Business Analytics and Intelligent Systems (Prof. Schiffer)