Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package LNA-Probe Co-Design

Wane, Sidina; Bajon, Damienne; Lesenechal, Dominique; Russer, Johannes A.; Thomas, David; Russer, Peter

Computational Photonics (Prof. Jirauschek)

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Document type:: Konferenzbeitrag
Author(s):: Wane, Sidina; Bajon, Damienne; Lesenechal, Dominique; Russer, Johannes A.; Thomas, David; Russer, Peter
Title:: Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package LNA-Probe Co-Design
Abstract:: In this paper, we present an evaluation of state of the art Near-Field scanning systems, operating in the frequency-domain. Alternative Time-Domain based Two-Probe Near-Field scanner suitable for stochastic signals and accounting for Field-Field correlations is assessed. Dedicated satellite wireless Chip-to-Chip communication link is used as carrier for evaluating both the frequency-domain and the Time-Domain Two-Probe Near-Field scanning solutions. Perspectives for Chip-Package LNA-Probe Co-Design are drawn for high spatial resolution Near-Field scanning systems with controlled sensitivity and noise uncertainties. «
In this paper, we present an evaluation of state of the art Near-Field scanning systems, operating in the frequency-domain. Alternative Time-Domain based Two-Probe Near-Field scanner suitable for stochastic signals and accounting for Field-Field correlations is assessed. Dedicated satellite wireless Chip-to-Chip communication link is used as carrier for evaluating both the frequency-domain and the Time-Domain Two-Probe Near-Field scanning solutions. Perspectives for Chip-Package LNA-Probe Co-Des... »
Book / Congress title:: Proceedings of the European Microwave Conference
Publisher address:: London, England
Year:: 2016
Month:: October
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