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Titel:

Kinetic Monte Carlo of transport processes in Al/AlOx/Au-layers: Impact of defects

Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Weiler, B.; Haeberle, T.; Gagliardi, A.; Lugli, P.
Abstract:
Ultrathin films of alumina were investigated by a compact kMC-model. Experimental jV-curves from Al/AlOx/Au-junctions with plasma- and thermal-grown AlOx were fitted by simulated ones. We found dominant defects at 2.3-2.5 eV below CBM for AlOx with an effective mass m∗ox=mox∗=0.35 m0 and a barrier EB,Al/AlOx≈2.8EB,Al/AlOx≈2.8 eV in agreement with literature. The parameterization is extended to varying defect levels, defect densities, injection barriers, effective masses and the thickness of AlOx...     »
Stichworte:
Defect levels Tunneling Crystal defects Current density Effective mass
Zeitschriftentitel:
AIP Advances 6, 095112 2016-09
Jahr:
2016
Jahr / Monat:
2016-09
Quartal:
3. Quartal
Monat:
Sep
Sprache:
en
Volltext / DOI:
doi:10.1063/1.4963180
WWW:
http://scitation.aip.org/content/aip/journal/adva/6/9/10.1063/1.4963180
Verlag / Institution:
AIP Publishing LLC
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