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Title:

X-Ray Near-Field Ptychography for Optically Thick Specimens

Author(s):
Stockmar, Marco; Zanette, Irene; Dierolf, Martin; Enders, Bjoern; Clare, Richard; Pfeiffer, Franz; Cloetens, Peter; Bonnin, Anne; Thibault, Pierre
Journal title:
Physical Review Applied
Year:
2015
Journal volume:
3
Journal issue:
1
Fulltext / DOI:
doi:10.1103/physrevapplied.3.014005
Publisher:
American Physical Society (APS)
E-ISSN:
2331-7019
Date of publication:
21.01.2015
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