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Title:

X-ray beam-position monitoring in the sub-micrometre and sub-second regime

Author(s):
Bunk, Oliver; Pfeiffer, Franz; Stampanoni, Marco; Patterson, Bruce D.; Schulze-Briese, Clemens; David, Christian
Journal title:
J Synchrotron Radiat
Year:
2005
Journal volume:
12
Pages contribution:
795-799
Fulltext / DOI:
doi:10.1107/s0909049505028189
Publisher:
International Union of Crystallography (IUCr)
Date of publication:
18.10.2005
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