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- Author(s):
- Bunk, Oliver; Pfeiffer, Franz; Stampanoni, Marco; Patterson, Bruce D.; Schulze-Briese, Clemens; David, Christian
- Title:
- X-ray beam-position monitoring in the sub-micrometre and sub-second regime
- Journal title:
- J Synchrotron Radiat
- Year:
- 2005
- Journal volume:
- 12
- Pages contribution:
- 795-799
- Fulltext / DOI:
- doi:10.1107/s0909049505028189
- Publisher:
- International Union of Crystallography (IUCr)
- Date of publication:
- 18.10.2005
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