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Title:

Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

Author(s):
Kewish, Cameron M.; Thibault, Pierre; Dierolf, Martin; Bunk, Oliver; Menzel, Andreas; Vila-Comamala, Joan; Jefimovs, Konstantins; Pfeiffer, Franz
Journal title:
Ultramicroscopy
Year:
2010
Journal volume:
110
Pages contribution:
325-329
Fulltext / DOI:
doi:10.1016/j.ultramic.2010.01.004
Publisher:
Elsevier BV
Date of publication:
01.03.2010
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