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Title:

Correlation of X-Ray Dark-Field Radiography to Mechanical Sample Properties

Author(s):
Malecki, Andreas; Eggl, Elena; Schaff, Florian; Potdevin, Guillaume; Baum, Thomas; Garcia, Eduardo Grande; Bauer, Jan S.; Pfeiffer, Franz
Journal title:
Microscopy and Microanalysis
Year:
2014
Journal volume:
20
Journal issue:
05
Pages contribution:
1528-1533
Fulltext / DOI:
doi:10.1017/s1431927614001718
Publisher:
Cambridge University Press (CUP)
Date of publication:
01.07.2014
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