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Dokumenttyp:
Journal Article; Research Support, Non-U.S. Gov't
Autor(en):
Malecki, Andreas; Eggl, Elena; Schaff, Florian; Potdevin, Guillaume; Baum, Thomas; Garcia, Eduardo Grande; Bauer, Jan S; Pfeiffer, Franz
Titel:
Correlation of X-ray dark-field radiography to mechanical sample properties.
Abstract:
The directional dark-field signal obtained with X-ray grating interferometry yields direction-dependent information about the X-ray scattering taking place inside the examined sample. It allows examination of its morphology without the requirement of resolving the micrometer size structures directly causing the scattering. The local morphology in turn gives rise to macroscopic mechanical properties of the investigated specimen. In this study, we investigate the relation between the biomechanical...     »
Zeitschriftentitel:
Microsc Microanal
Jahr:
2014
Band / Volume:
20
Heft / Issue:
5
Seitenangaben Beitrag:
1528-33
Sprache:
eng
Volltext / DOI:
doi:10.1017/S1431927614001718
PubMed:
http://view.ncbi.nlm.nih.gov/pubmed/24983688
Print-ISSN:
1431-9276
TUM Einrichtung:
Fachgebiet Neuroradiologie (Prof. Zimmer)
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