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Dokumenttyp:
Konferenzbeitrag
Autor(en):
Mildner, Michael and Brunner, Michaela and Gruber, Michael and Baehr, Johanna and Sigl, Georg
Titel:
Fault-Simulation-Based Flip-Flop Classification for Reverse Engineering
Abstract:
This work outlines a crucial step in gate-level netlist reverse engineering: classifying control and data flip-flops (FFs) to discern control logic and data paths. Existing methods rely mainly on structural characteristics, which can have disavantages. Our work introduces a novel approach that classifies FFs based on observed characteristics after fault insertion and propagation. We develop three new classification methods for block cipher implementations, emphasizing their significance in syste...     »
Stichworte:
Ciphers; Reverse engineering; Logic gates; Security; Flip-flops; Flip-Flop Classification; Fault Simulation; Block Cipher; Hardware Reverse Engineering
Dewey-Dezimalklassifikation:
620 Ingenieurwissenschaften
Kongress- / Buchtitel:
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
Kongress / Zusatzinformationen:
Kielce, Poland
Datum der Konferenz:
03.04.-05.04.2024
Jahr:
2024
Quartal:
2. Quartal
Jahr / Monat:
2024-04
Monat:
Apr
Seiten:
53-56
Reviewed:
ja
Sprache:
en
Volltext / DOI:
doi:10.1109/DDECS60919.2024.10508905
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