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Document type:
Zeitschriftenaufsatz 
Author(s):
Faust, T.; Rieger, Seitner, M.J.; J.; Kotthaus, J.P.; Weig, E.M. 
Title:
Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators 
Abstract:
The damping rates of high quality factor nanomechanical resonators are well beyond intrinsic limits. Here,we explore the underlying microscopic loss mechanisms by investigating the temperature-dependent dampingof the fundamental and third harmonic transverse flexural mode of a doubly clamped silicon nitride string. Itexhibits characteristic maxima reminiscent of two-level defects typical for amorphous materials. Coupling tothose defects relaxes the momentum selection rules, allowing energy trans...    »
 
Dewey Decimal Classification:
010 Bibliografien 
Journal title:
PHYSICAL REVIEW B89, 100102(R) (2014) 
Year:
2014 
Year / month:
2014-03 
Quarter:
1. Quartal 
Month:
Mar 
Language:
en 
Publisher:
American Physical Society APS