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- Title:
Imaging the variation in band bending across a silicon pn junction surface using spectromicroscopy
- Author(s):
- Phaneuf, R. J.; Kan, H.-C.; Marsi, M.; Gregoratti, L.; Günther, S.; Kiskinova, M.
- Journal title:
- J. Appl. Phys.
- Year:
- 2000
- Journal volume:
- 88
- Pages contribution:
- 863
- Fulltext / DOI:
- doi:10.1063/1.373748
- Publisher:
- AIP Publishing
- Date of publication:
- 01.01.2000
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