Bruker - Franzen Analytik GmbH
Verfahren und Vorrichtung zur Kalibration stark fluktuierender Meßsignale für die quantitative Analyse von Gasgemischen mittels resonanter Lasermassenspektrometrie
1994

Zimmermann, R.;Weickhardt, C.;Boesl, U.;Schlag, E.W.
Influence of Chlorine Substituent Positions on the Molecular-Structure and the Torsional Potentials of Dichlorinated Biphenyls - R2pi Spectra of the 1st Singlet Transition and Am1 Calculations
Journal of Molecular Structure
1994
327
81-97

Zimmermann, R.;Lenoir, D.;Schramm, K.W.;Kettrup, A.;Boesl, U.
Resonance-Enhanced Multi-Photon Ionization (REMPI)/ Mass Spectrometry for Analysis of Chlorinated Compounds: the First REMPI Spectrum of a Chlorinated Dibenzofuran
Organohalogen Compounds
1994
19
155-160

Zimmermann, R.;Boesl, U.;Weickhardt, C.;Lenoir, D.;Schramm, K.W.;Kettrup, A.;Schlag, E.W.
Isomer-Selective Ionization of Chlorinated Aromatics with Lasers for Analytical Time-of-Flight Mass-Spectrometry - First Results for Polychlorinated Dibenzo-P-Dioxins (Pcdd), Biphenyls (Pcb) and Benzenes (Pcbz)
Chemosphere
1994
29
1877-1888

Weinkauf, R.;Boesl, U.
Laser Spectroscopy of Molecular-Ions - the a-X Transition in the Ocs Radical-Cation
Journal of Chemical Physics
1994
101
8482-8493

Weickhardt, C.;Zimmermann, R.;Schramm, K.W.;Boesl, U.;Schlag, E.W.
Laser Mass-Spectrometry of the Dichlorobenzenes, Trichlorobenzenes and Tetrachlorobenzenes - Isomer-Selective Ionization and Detection
Rapid Communications in Mass Spectrometry
1994
8
381-384

Weickhardt, C.;Boesl, U.;Schlag, E.W.
Laser Mass-Spectrometry for Time-Resolved Multicomponent Analysis of Exhaust-Gas
Analytical Chemistry
1994
66
1062-1069

Vonfraunberg, W.D.;Drechsler, G.;Bassmann, C.;Boesl, U.;Schlag, E.W.
Collision-Induced Electron-Emission from Surfaces in Negative-Ion Time-of-Flight Mass-Spectrometry
International Journal of Mass Spectrometry and Ion Processes
1994
133
211-219

Frey, R.;Nagel, H.;Franzen, J.;Betzold, H.;Ulke, W.;Boesl, U.
Fast Multicomponent Exhaust Gas Analyzer for Dynamic Exhaust Measurements
SAE TECHNICAL PAPERS SERIES
1994
940826
25-29

Fraunberg, W.D.;Drechsler, G.;Bäßmann, C.;Boesl, U.;Schlag, E.W.
Collision Induced Secondary Electron Emission by Negative Ions in Time-of-Flight Mass Spectrometers
Int. J. Mass Spectrom. Ion Proc.
1994
133
211-219