Liang, Suzhe; Guan, Tianfu; Yin, Shanshan; Tu, Suo; Guo, Renjun; Bulut, Yusuf; Müller-Buschbaum, Peter : Technical University of Munich, TUM School of Natural Sciences, Department of Physics, Chair for Functional Materials, James-Franck-Str. 1, 85748 Garching, Germany. Bulut, Yusuf; Schwartzkopf, Matthias; Roth, V. Stephan: Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany. Reck, A. Kristian; Drewes, Jonas; Strunskus, Thomas; Faupel, Franz: Lehrstuhl für Materialverbunde, Institut für Materialwissenschaft, Christian-Albrechts-Universität zu Kiel, Kaiserstr. 2, 24143 Kiel, Germany. Chen, Wei: Shenzhen Key Laboratory of Ultraintense Laser and Advanced Material Technology, Center for Advanced Material Diagnostic Technology, and College of Engineering Physics, Shenzhen Technology University, Lantian Road 3002, Pingshan, Shenzhen 518118, P. R. China. Roth, V. Stephan: KTH Royal Institute of Technology, Department of Fibre and Polymer Technology, Teknikringen 56-58, SE-100 44 Stockholm, Sweden. Cheng, Ya-Jun: Ningbo Institute of Materials Technology & Engineering, Chinese Academy of Sciences, 1219 Zhongguan West Rd, Zhenhai District, Ningbo, Zhejiang Province, 315201, P. R. China. Cheng, Ya-Jun: College of Renewable Energy, Hohai University, 1915 Hohai Avenue, Changzhou, Jiangsu Province 213200, P. R. China.
X-ray scattering, ultra-thin metal layer, sputtering
Resource type:
Experimente und Beobachtungen / experiments and observations; Abbildungen von Objekten / image of objects; Statistik und Referenzdaten / statistics and reference data; Textdokumente / text documents
Data type:
Bilder / images ; Texte / texts
Description:
All data for the paper entitled with "In situ Studies Revealing the Effect of Au Surfactant on the Formation of Ultra-Thin Ag Layers Using High-Power Impulse Magnetron Sputter Deposition" published by Nanoscale Horizons
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