RapidCharacterization of Point Defects in Solid-StateIon Conductors Using Raman Spectroscopy, Machine-Learning Force Fields,and Atomic Raman Tensors

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Title:: RapidCharacterization of Point Defects in Solid-StateIon Conductors Using Raman Spectroscopy, Machine-Learning Force Fields,and Atomic Raman Tensors
Document type:: Zeitschriftenaufsatz
Author(s):: O'Leary, Willis ; Grumet, Manuel ; Kaiser, Waldemar ; Buc ko, Toma s ; Rupp, Jennifer L. M. ; Egger, David A.
Keywords:: Article
Journal title:: Journal of the American Chemical Society
Year:: 2024
Journal volume:: 146
Journal issue:: 39
Pages contribution:: 26863-26876
Fulltext / DOI:: doi:10.1021/jacs.4c07812
Publisher:: American Chemical Society
E-ISSN:: 0002-7863 ; 1520-5126
Date of publication:: 18.09.2024
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