Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain

Title:: Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain
Document type:: Zeitschriftenaufsatz
Author(s):: Pöller, Franziska; Salazar Bloise, Félix; Jakobi, Martin; Dong, Jie; Koch, Alexander W.
Journal title:: Sensors
Year:: 2021
Journal volume:: 21
Journal issue:: 16
Pages contribution:: 5572
Fulltext / DOI:: doi:10.3390/s21165572
Publisher:: MDPI AG
E-ISSN:: 1424-8220
Date of publication:: 19.08.2021
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