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- Title:
Oxygen related defects and vacancy clusters identified in sputtering grown UOx thin films by positron annihilation techniques
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Macchi, C.; Somoza, A.; Guimpel, J.; Suárez, S.; Egger, W.; Hugenschmidt, C.; Mariazzi, S.; Brusa, R.S.
- Journal title:
- Results in Physics
- Year:
- 2021
- Journal volume:
- 27
- Pages contribution:
- 104513
- Fulltext / DOI:
- doi:10.1016/j.rinp.2021.104513
- Publisher:
- Elsevier BV
- E-ISSN:
- 2211-3797
- Date of publication:
- 01.08.2021
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