AFM tip characterization by Kelvin probe force microscopy

Title:: AFM tip characterization by Kelvin probe force microscopy
Document type:: Zeitschriftenaufsatz
Author(s):: Barth, C; Hynninen, T; Bieletzki, M; Henry, C R; Foster, A S; Esch, F; Heiz, U
Journal title:: New Journal of Physics
Year:: 2010
Journal volume:: 12
Journal issue:: 9
Pages contribution:: 093024
Fulltext / DOI:: doi:10.1088/1367-2630/12/9/093024
Publisher:: IOP Publishing
E-ISSN:: 1367-2630
Date of publication:: 15.09.2010
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