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Title:

Carbon Memory Assessment

Document type:
Konferenzband
Editor:
ITRS
Congress / additional information:
ITRS ERD meeting
Abstract:
The geometrical and performance scaling of silicon CMOS integrated circuit technology over the past 50 years has enabled many affordable new products for business and consumer applications. Recognizing that Flash is approaching its ultimate physical scaling limits within the next 10 years or so, the global electronics research community has begun an intense search for a new paradigm and technology for extending the functional scaling of memory technologies. Several promising nonvolatile memory c...     »
Organization:
ITRS
Date of publication:
25.08.2014
Year:
2014
Quarter:
3. Quartal
Year / month:
2014-08
Pages:
50
Language:
en
Publication format:
WWW
TUM Institution:
Hybride Elektronische Systeme
Format:
Text
 BibTeX