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- Title:
Exploring the Limits of the Safe Operation Area of Power Semiconductor Devices
- Document type:
- Konferenzbeitrag
- Author(s):
- Sandow, C.; Baburske, R.; Niedernostheide, F.-J.; Pfirsch, F.; Toechterle, C.
- Pages contribution:
- pp. 49-52
- Book / Congress title:
- Proceedings of the International Conference on Simulation of Semiconductor Processe and Devices
- Congress (additional information):
- SISPAD 2014, September 9-11, Yokohama, Japan
- Year:
- 2014
- Language:
- en
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