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Title:

Determination of Interphase Thickness in Silicone Nanocomposites from Dielectric Properties

Document type:
Konferenzbeitrag
Author(s):
Rempe, A.-S.; Kindersberger, J.; Willner, E.-M.; Dietz, H.
Book / Congress title:
2020 IEEE 3rd International Conference on Dielectrics
Congress (additional information):
Virtual Edition
Organization:
Instituto de Tecnologia Electrica (ITE), Valencia, Spain
Date of congress:
06.07.2020 - 31.07.2020
Year:
2020
Reviewed:
ja
Language:
en
TUM Institution:
HSA
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