Electronic Structure and Optoelectronic Properties of Bismuth Oxyiodide Robust against Percent‐Level Iodine‐, Oxygen‐, and Bismuth‐Related Surface Defects
Document type:
Zeitschriftenaufsatz
Author(s):
Huq, Tahmida N.; Lee, Lana C.; Eyre, Lissa; Li, Weiwei; Jagt, Robert A.; Kim, Chaewon; Fearn, Sarah; Pecunia, Vincenzo; Deschler, Felix; MacManus‐Driscoll, Judith L.; Hoye, Robert L. Z.