A New Silicon Drift Detector System for Kaonic Atom Measurements

Trippl, C; Zmeskal, J; Aikawa, S; Amirkhani, A; Bazzi, M; Bellotti, G; Berucci, C; Bosnar, D; Bragadireanu, A M; Cargnelli, M; Curceanu, C; Dawood Butt, A; Del Grande, R; Fabbietti, L; Fiorini, C; Ghio, F; Guaraldo, C; Hashimoto, T; Hayano, S R; Iliescu, M; Ishimoto, S; Iwasaki, M; Levi Sandri, P; Ma, Y; Marton, J; Miliucci, M; Moskal, P; Noumi, H; Ohnishi, H; Okada, S; Outa, H; Pietreanu, D; Piscicchia, K; Sakuma, F; Sato, M; Scordo, A; Shi, H; Sirghi, D; Sirghi, F; Spallone, A; Vazquez Doce, O; Widmann, E     «

Trippl, C; Zmeskal, J; Aikawa, S; Amirkhani, A; Bazzi, M; Bellotti, G; Berucci, C; Bosnar, D; Bragadireanu, A M; Cargnelli, M; Curceanu, C; Dawood Butt, A; Del Grande, R; Fabbietti, L; Fiorini, C; Ghio, F; Guaraldo, C; Hashimoto, T; Hayano, S R; Iliescu, M; Ishimoto, S; Iwasaki, M; Levi Sandri, P; Ma, Y; Marton, J; Miliucci, M; Moskal, P; Noumi, H; Ohnishi, H; Okada, S; Outa, H; Pietreanu, D; Piscicchia, K; Sakuma, F; Sato, M; Scordo, A; Shi, H; Sirghi, D; Sirghi, F; Spallone, A; Vazquez Doce, O...     »