Reflectron Time-of-Flight Mass-Spectrometry and Laser Excitation for the Analysis of Neutrals, Ionized Molecules and Secondary Fragments

Title:: Reflectron Time-of-Flight Mass-Spectrometry and Laser Excitation for the Analysis of Neutrals, Ionized Molecules and Secondary Fragments
Document type:: Zeitschriftenaufsatz
Author(s):: Boesl, U.; Weinkauf, R.; Schlag, E.W.
Journal title:: International Journal of Mass Spectrometry and Ion Processes
Year:: 1992
Journal volume:: 112
Pages contribution:: 121-166
Language:: en
Ingested:: 28.07.2008
Last change:: 28.07.2008
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