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Titel:

Imaging size-selected silicon clusters with a low-temperature scanning tunneling microscope

Autor(en):
Messerli, Stephane; Schintke, Silvia; Morgenstern, Karina; Sanchez, Antonio; Heiz, Ueli; Schneider, Wolf-Dieter
Abstract:
Size-selected Si30 and Si39 clusters produced by a laser vaporization cluster source are deposited on the Ag(111) surface at room temp. and at liq.-nitrogen temp. resp. Subsequently, the sample is transferred at low temp. (120 K) in a sep. mobile ultrahigh vacuum chamber (vacuum-suitcase) from the cluster source to a low-temp. scanning tunneling microscope (STM). Soft landing of the supported clusters is indicated by the following observations: (i) at.-resoln. images taken at low bias voltages s...     »
Stichworte:
Ion beam-induced epitaxy (cluster imaging size-selected Si clusters with low-temp. scanning tunneling microscope after) Scanning tunneling microscopes (imaging size-selected Si clusters with low-temp.) silicon cluster epitaxy scanning tunneling microscope
Kongresstitel:
CAN 134:33312 66-3 Surface Chemistry and Colloids Institut de Physique de la Matiere Condensee, Universite de Lausanne, Lausanne, Switz. Journal 0039-6028 7440-22-4 (Silver) Role: NUU (Other use, unclassified), USES (Uses) (imaging size-selected Si clusters on); 145810-87-3 (Silicon, mol. (Si30)); 145810-89-5 (Silicon, mol. (Si39)) Role: PEP (Physical, engineering or chemical process), PRP (Properties), PROC (Process) (imaging size-selected Si clusters with low-temp. scanning tunneling microsc...     »
Zeitschriftentitel:
Surf. Sci.
Jahr:
2000
Band / Volume:
465
Heft / Issue:
3
Seitenangaben Beitrag:
331-338
Volltext / DOI:
doi:10.1016/S0039-6028(00)00722-6
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