- Image title:
- Daniela Pfister at the X-ray diffractometer
- Image explanation:
- First author Daniela Pfister measuring a sample of SnIP at the X-ray-diffractometer
- Event:
- Press release Sept. 12, 2016
- Individual people:
- Daniela Pfister
- Keywords:
- Semiconductor; flexible; double helix; phosphorous; tin; iodine; SnIP; nano; material; one-dimensional
- Faculty:
- Chemistry
- Chair / Science unit:
- Work group for synthesis and characterization of innovative materials
- TUM location:
- Garching
- Event date / year:
- 25.08.2016
- Document type:
- Image
- Source:
- TUM Fotostelle
- Original File:
- /file/1324633/20160825_Pfister_Daniela_AH_261605.jpg
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