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Title:

AFM tip characterization by Kelvin probe force microscopy

Document type:
Zeitschriftenaufsatz
Author(s):
Barth, C; Hynninen, T; Bieletzki, M; Henry, C R; Foster, A S; Esch, F; Heiz, U
Journal title:
New Journal of Physics
Year:
2010
Journal volume:
12
Journal issue:
9
Pages contribution:
093024
Fulltext / DOI:
doi:10.1088/1367-2630/12/9/093024
Publisher:
IOP Publishing
E-ISSN:
1367-2630
Date of publication:
15.09.2010
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