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Title:

How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope

Author(s):
Carlo, Dri; Friedrich, Esch; Cristina, Africh; Giovanni, Comelli
Abstract:
The implementation of fast measurement modes in conventional scanning tunneling microscopes (STM) generally implies that at least the fast scanning frequency reaches or exceeds the first resonance frequency of the scanning stage. We present a straightforward protocol for the determination of accessible frequency windows, where high spatial resolution can be routinely achieved and maintained during the fast scanning movement. This protocol relies on a simple, in situ method to locate these freque...     »
Journal title:
Measurement Science and Technology
Year:
2012
Journal volume:
23
Journal issue:
5
Pages contribution:
055402
Fulltext / DOI:
doi:10.1088/0957-0233/23/5/055402
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