Combined TPRx, in situ GISAXS and GIXAS studies of model semiconductor-supported platinum catalysts in the hydrogenation of ethene

The preparation, characterization and catalytic reactivity of a GaN supported Pt catalyst in the hydrogenation of ethene are presented in this feature article, highlighting the use of in situ characterization of the material properties during sample handling and catalysis by combining temperature programmed reaction with in situ grazing incidence small-angle X-ray scattering and X-ray absorption spectroscopy. The catalysts are found to be sintering resistant at elevated temperatures as well as during reduction and hydrogenation reactions. In contrast to Pt particles of approximately 7 nm diameter, smaller particles of 1.8 nm in size are found to dynamically adapt their shape and oxidation state to the changes in the reaction environment. These smaller Pt particles also showed an initial deactivation in ethene hydrogenation, which is paralleled by the change in the particle shape. The subtle temperature-dependent X-ray absorbance of the 1.8 nm sized Pt particles indicates that subtle variations in the electronic structure induced by the state of reduction by electron tunnelling over the Schottky barrier between the Pt particles and the GaN support can be monitored.     «

The preparation, characterization and catalytic reactivity of a GaN supported Pt catalyst in the hydrogenation of ethene are presented in this feature article, highlighting the use of in situ characterization of the material properties during sample handling and catalysis by combining temperature programmed reaction with in situ grazing incidence small-angle X-ray scattering and X-ray absorption spectroscopy. The catalysts are found to be sintering resistant at elevated temperatures as well as d...     »

ISI Document Delivery No.: 599PV Times Cited: 10 Cited Reference Count: 62 Wyrzgol, Sonja A. Schaefer, Susanne Lee, Sungsik Lee, Byeongdu Di Vece, Marcel Li, Xuebing Seifert, Soenke Winans, Randall E. Stutzmann, Martin Lercher, Johannes A. Vajda, Stefan Deutsche Forschungsgemeinschaft (DFG) through TUM International Graduate School of Science and Engineering (IGSSE); US Department of Energy [DE-AC-0206CH11357]; Air Force Office of Scientific Research The work at the Technische Universitat Munchen (TUM) was supported by Deutsche Forschungsgemeinschaft (DFG) through the TUM International Graduate School of Science and Engineering (IGSSE). TEM and AFM analysis was performed at the Laboratory of Electron microscopy, Department of Chemistry, Technische Universitat Munchen. The work at the Argonne National Laboratory was supported by the US Department of Energy, BES-Chemical Sciences and BES-Scientific User Facilities under Contract DE-AC-0206CH11357 with UChicago Argonne, LLC, Operator of Argonne National Laboratory. MDV and SV gratefully acknowledge the support by the Air Force Office of Scientific Research. 10 Royal soc chemistry Cambridge     «

ISI Document Delivery No.: 599PV Times Cited: 10 Cited Reference Count: 62 Wyrzgol, Sonja A. Schaefer, Susanne Lee, Sungsik Lee, Byeongdu Di Vece, Marcel Li, Xuebing Seifert, Soenke Winans, Randall E. Stutzmann, Martin Lercher, Johannes A. Vajda, Stefan Deutsche Forschungsgemeinschaft (DFG) through TUM International Graduate School of Science and Engineering (IGSSE); US Department of Energy [DE-AC-0206CH11357]; Air Force Office of Scientific Research The work at the Technische Universitat Munc...     »