S. Chakravorti, H.Steinbigler
Boundary Element studies on insulator shape and electric field around HV insulators with or without pollution
169 - 176
IEEE Transactions on Dielectrics and Electrical Insulation
2000

Kindersberger, J.; Löbl, H.; Schoft, S.
Plastic Deformation and Loss of Joint Force by Creep in High Current Joints
20th International Conference on Electrical Contacts (ICEC)
Stockholm, Sweden, June. 19-23, 2000
2000

Rühling, F.; Heilbronner, F.; Diaz, R.; Ortega, P.
How Does the Laboratory´s Ion Density Affect the First Discharge Under Impulse Voltages?
XIII. International Conference on Gas Discharges and their Applications
2000

Schöffner, G.
The Acoustic Method for PD-Measurement in N2-SF6 Gas Mixtures
417 - 421
Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Victoria, British Columbia, Oct. 15-18, 2000
2000

Schöffner, G.
A Directional Coupler System for the Direction Sensitive Measurement of UHF-PD Signals in GIS and GIL
634 - 638
Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Victoria, British Columbia, Oct. 15-18, 2000
2000

Messerer, F.; Boeck, W.
Gas Insulated Substation (GIS) for HVDC
698 - 702
Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Victoria, British Columbia, Oct. 15-18, 2000
2000

Hinterholzer, T.; Boeck, W.
Breakdown in SF6 influenced by Corona-Stabilization
413 - 416
Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Victoria, British Columbia, Oct. 15-18, 2000
2000

Graf, R.; Boeck, W.
Defect sensibility of N2-SF6 gas mixtures with equal dielectric strength
422 - 425
Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Victoria, British Columbia, Oct. 15-18, 2000
2000

Finkel, M.;Boeck, W.; Kynast, E.
Determination of Minimum Breakdown Voltage for GIL and GIS
401 - 404
Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Victoria, British Columbia, Oct. 15-18, 2000
2000

Finkel, M.; Boeck, W.; Jänicke, L.; Kynast, E.
Experimental Studies on the Statistical Breakdown Characteristic of SF6
405 - 408
IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Victoria, British Columbia, Oct. 15-18, 2000
2000