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Document type:
Zeitschriftenaufsatz 
Author(s):
Philipp Wagner, Thomas Wild, Andreas Herkersdorf 
Title:
DiaSys: Improving SoC insight through on-chip diagnosis 
Abstract:
To find the cause of a functional or non-functional defect (bug) in software running on a multi-processor System-on-Chip (MPSoC), developers need insight into the chip. Tracing systems provide this insight non-intrusively, at the cost of high off-chip bandwidth requirements. This I/O bottleneck limits the observability, a problem becoming more severe as more functionality is integrated on-chip. In this paper, we present DiaSys, an MPSoC diagnosis system with the potential to replace today’s trac...    »
 
Keywords:
OpTiMSoC 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Journal title:
Journal of Systems Architecture 
Year:
2017 
Year / month:
2017-01 
Reviewed:
ja 
Language:
en 
Publisher:
Elsevier 
Status:
Verlagsversion / published 
Date of publication:
12.01.2017 
TUM Institution:
Lehrstuhl für Integrierte Systeme