Void-growing: a novel Scan-to-BIM method for manhattan world buildings from point cloud

Pan, Yuandong; Braun, Alex; Borrmann, André; Brilakis, Ioannis

doi:10.35490/ec3.2021.162

Dokumenttyp:: Konferenzbeitrag
Autor(en):: Pan, Yuandong; Braun, Alex; Borrmann, André; Brilakis, Ioannis
Titel:: Void-growing: a novel Scan-to-BIM method for manhattan world buildings from point cloud
Kongress- / Buchtitel:: Proceedings of the 2021 European Conference on Computing in Construction
Verlag / Institution:: University College Dublin
Publikationsdatum:: 26.07.2021
Jahr:: 2021
Volltext / DOI:: doi:10.35490/ec3.2021.162
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