Gungerich, V.; Janke, B.; Zinkler, F.; Heinrich, W.; Russer, P.
Abstract:
For two different types of MMIC FET-oscillators, simulation results obtained by state-of-the-art methods of analysis are compared with measurements for a wide range of drain bias-voltage. Quantitatively, agreement is not yet satisfactory for practical applications. The deviations can be attributed not only to uncertainties in the nonlinear FET model but also to inherent properties of the methods of analysis
Stichworte:
MMIC, microwave oscillators, bias-voltage dependence, circuit analysis computing, drain bias-voltage, FET-oscillators, field effect integrated circuits, MMIC oscillator simulation, nonlinear FET model
Kongress- / Buchtitel:
Microwave Symposium Digest, 1994., IEEE MTT-S International