Stochastic EMI sources localization based on ultra wide band near-field measurements

Title:: Stochastic EMI sources localization based on ultra wide band near-field measurements
Document type:: Konferenzbeitrag
Author(s):: Baev, Andrey; Gorbunova, Anastasia; Konovalyuk, Maxim; Kuznetsov, Yury; Russer, Johannes A.
Book / Congress title:: European Microwave Conference (EuMC)
Publisher:: IEEE
Year:: 2013
Month:: October
Pages:: 1131--1134
WWW:: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6686861
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