Stochastic EMI sources localization based on ultra wide band near-field measurements

Titel:: Stochastic EMI sources localization based on ultra wide band near-field measurements
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Baev, Andrey; Gorbunova, Anastasia; Konovalyuk, Maxim; Kuznetsov, Yury; Russer, Johannes A.
Kongress- / Buchtitel:: European Microwave Conference (EuMC)
Verlag / Institution:: IEEE
Jahr:: 2013
Monat:: October
Seiten:: 1131--1134
WWW:: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6686861
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