D. Sekar, B. Bateman, U. Raghuram, S. Bowyer, *Y. Bai, M. Calarrudo, P. Swab, J. Wu, S. Nguyen, N. Mishra, R. Meyer, M. Kellam, B. Haukness, C. Chevallier, * H. Wu, * H. Qian, ** F. Kreupl and G. Bronner
Technology and Circuit Optimization of Resistive RAM for Low-Power, Reproducible Operation
IEDM
International Electron Devices Meeting (IEDM)
IEEE
2014