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Dokumenttyp:
Konferenzband
Herausgeber:
ITRS
Titel:
Carbon Memory Assessment
Kongress / Zusatzinformationen:
ITRS ERD meeting
Abstract:
The geometrical and performance scaling of silicon CMOS integrated circuit technology over the past 50 years has enabled many affordable new products for business and consumer applications. Recognizing that Flash is approaching its ultimate physical scaling limits within the next 10 years or so, the global electronics research community has begun an intense search for a new paradigm and technology for extending the functional scaling of memory technologies. Several promising nonvolatile memory c...     »
Ausrichter der Konferenz:
ITRS
Publikationsdatum:
25.08.2014
Jahr:
2014
Quartal:
3. Quartal
Jahr / Monat:
2014-08
Seiten/Umfang:
50
Sprache:
en
Publikationsform:
WWW
TUM Einrichtung:
Hybride Elektronische Systeme
Format:
Text
 BibTeX