Kaczer, B.; Larcher, L.; Vandelli, L.; Reisinger, H.; Popovici, M.; Clima, S.; Ji , Z.; Joshi, S.; Swerts, J.; Redolfi, A.; Afanas’ev, V.V.; Jurczak, M.
SrTiO 3 for sub-20 nm DRAM technology nodes—characterization and modeling
SISC 2014 45 th IEEE Semiconductor Interface Specialists Conference, Session 12 - Memory Session Chair: M. Passlack 12.3
San Diego CA USA, 10-13 Dec 2014 2014-12
IEEE Xplore Digital Library
2014