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Dokumenttyp:
Konferenzbeitrag
Autor(en):
Kasper, E.; Wanner, R.; Russer, P.
Titel:
Resonance phase operation of heterobipolar transistors beyond their transit frequency
Abstract:
In this paper we explain the resonant enhancement of the current gain at frequencies beyond the transit frequency and we describe the experimental verification of the resonance phase effect. A resonance phase transistor (RPT) is an HBT where transit time effects in the base region and the collector junction are utilized to achieve amplification beyond the transit frequency fT. In this work a relatively thick graded SiGe base layer of 120nm is used to facilitate accurate experimental characteriza...     »
Stichworte:
SiGe, Ge-Si alloys, heterojunction bipolar transistors, millimeter wave transistors, 40 GHz, 120 nm, 6.5 dB, millimetre wave transistors, resonance phase effect, resonance phase transistor, transit frequency, current gain, resonant enhancement, 20 V, base region, breakdown voltage, collector junction, heterobipolar transistors, resonance phase operation, RPT cascode circuit, semiconductor device breakdown, thick graded base layer, transit time effects
Kongress- / Buchtitel:
Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the
Jahr:
2005
Seiten:
155--162
Volltext / DOI:
doi:10.1109/BIPOL.2005.1555223
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