A 15 GHz coplanar HEMT oscillator is analyzed in the time domain using a large signal transistor model for signal and noise analysis and phase noise calculation. The transistor model parameters in a wide bias range (200 bias points) are determined from DC, S-parameter and noise measurements, using cold and hot modelling techniques in combination with deembedding procedures. The model includes a low frequency fa noise source. Results of phase noise measurements are compared with calculated data and agree within \$\textbackslashpm\$5 dB     «

A 15 GHz coplanar HEMT oscillator is analyzed in the time domain using a large signal transistor model for signal and noise analysis and phase noise calculation. The transistor model parameters in a wide bias range (200 bias points) are determined from DC, S-parameter and noise measurements, using cold and hot modelling techniques in combination with deembedding procedures. The model includes a low frequency fa noise source. Results of phase noise measurements are compared with calculated data a...     »

equivalent circuits, microwave integrated circuits, time domain analysis, time-domain analysis, phase noise, S-parameters, 15 GHz, microwave oscillators, semiconductor device noise, high electron mobility transistors, nonlinear network analysis, cold modelling techniques, coplanar HEMT oscillator, DC measurements, deembedding procedures, HEMT oscillator, hot modelling techniques, large signal analysis, large signal transistor model, low frequency noise source, model parameters, noise measurements, random noise, S-parameter measurements, SHF     «

equivalent circuits, microwave integrated circuits, time domain analysis, time-domain analysis, phase noise, S-parameters, 15 GHz, microwave oscillators, semiconductor device noise, high electron mobility transistors, nonlinear network analysis, cold modelling techniques, coplanar HEMT oscillator, DC measurements, deembedding procedures, HEMT oscillator, hot modelling techniques, large signal analysis, large signal transistor model, low frequency noise source, model parameters, noise measurement...     »