insertion loss, variable-frequency oscillators, design, surface acoustic wave devices, ultrasonic devices, acoustic delay lines, phase-locked loop, 2.5 GHz, Q value, PLL, low noise, 158 ns, 22 dB, 300 kHz, 75.4 MHz, acoustic surface transverse wave delay lines, delay-line electromagnetic feedthrough, fifth harmonic, group delay time, microstrip rat-race coupler, phase locked, phase-locked loops, phase-noise-to-carrier ratio, rotated Y-cut quartz substrates, single-sideband, surface transverse wave voltage controlled oscillator
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insertion loss, variable-frequency oscillators, design, surface acoustic wave devices, ultrasonic devices, acoustic delay lines, phase-locked loop, 2.5 GHz, Q value, PLL, low noise, 158 ns, 22 dB, 300 kHz, 75.4 MHz, acoustic surface transverse wave delay lines, delay-line electromagnetic feedthrough, fifth harmonic, group delay time, microstrip rat-race coupler, phase locked, phase-locked loops, phase-noise-to-carrier ratio, rotated Y-cut quartz substrates, single-sideband, surface transverse wa...
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