Near-Field Measurement of Connected Smart RFIC Objects accounting for Environmental Uncertainties

Title:: Near-Field Measurement of Connected Smart RFIC Objects accounting for Environmental Uncertainties
Document type:: Konferenzbeitrag
Author(s):: Wane, Sidina; Bajon, Damienne; Lesenechal, Dominique; Russer, Johannes A.; Russer, Peter; Thomas, David; Tanner, Gregor; Gradoni, Gabriele; Kuznetsov, Yury
Abstract:: EmergenceofconnectedsmartobjectsputnewrequirementsonRFICdesign,modelingandexperimentalverification. Near-Fieldmeasurementappearsasabridginggapbetweencircuitdesign(RFIC-Chip-Package-PCB)andfieldradiation(Antennas)withthefollowingdrivingmotivations: *VerificationofEMC/EMIcomplianceforproductevaluationandqualification(certification-oriented). *DiagnosisofPowerIntegrity(PI),SignalIntegrity(SI)andEMC/EMIproblemsfordesignimprovement(Debug-oriented). *CoupledanalysisofspatialradiatedfielddistributionsandSpectral-domain/Time-domainresponsesforoptimizationofdynamicpowermanagement(Awareness). Stochasticapproachesarenotonlynecessarybecauseofourpartialorinsufficientknowledgeofthemechanismsunderlyingthetruephysics,theyalsoreflectvariousuncertainties. Challenges of properSystem-LevelModeling& PredictiveAnalysis
Book / Congress title:: Proceedings of the European Microwave Conference
Publisher address:: London, England
Year:: 2016
Month:: October
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