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- Titel:
Testchip for high temperature superconductor passive devices
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Dill, R.; Otto, J.; Riha, G.; Russer, P.; Schultz, L.; Solkner, G.; Valenzuela, A. A.; Wolfgang, E.
- Abstract:
- A testchip for fully characterizing high-temperature-superconducting (HTS) thin-film properties relevant to planar passive microwave device applications is presented. The chip integrates coplanar resonators and transmission lines along with structures for process monitoring. Measurements of the quality factor of coplanar resonators as a function of temperature and input power are reported. For the coupling of the resonators to the input signals, microwave probes with 40-GHz bandwidth have been u... »
- Stichworte:
- superconducting devices, transmission lines, resonators, 40 GHz, quality factor, solid-state microwave devices, 77 K, high-temperature superconductors, superconducting thin films, strip line components, temperature, process monitoring, high temperature superconductor, 5 GHz, test equipment, coplanar resonators, electron device testing, input power, microwave probes, planar passive microwave device applications, testchip, thin-film properties
- Kongress- / Buchtitel:
- Microwave Symposium Digest, 1990., IEEE MTT-S International
- Jahr:
- 1990
- Seiten:
- 863--866 vol.2
- Volltext / DOI:
- doi:10.1109/MWSYM.1990.99684
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