Benutzer: Gast  Login
Titel:

Stochastic EMI sources localization based on ultra wide band near-field measurements

Dokumenttyp:
Konferenzbeitrag
Autor(en):
Baev, A.; Gorbunova, A.; Konovalyuk, M.; Kuznetsov, Y.; Russer, J.
Abstract:
A localization technique for stochastic EMI sources based on time domain measurements of EM near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The main limitations for scanning parameters are discussed. The case study for a frequency and spatial localizations of equivalent point sources is presented based on the modeling and me...     »
Kongress- / Buchtitel:
European Microwave Conference (EuMC), 1131--1134 (2013)
Kongress / Zusatzinformationen:
Nuremberg, Germany, Oct 06 - 10, 2013
Verlag / Institution:
IEEE Xplore Digital Library
Jahr:
2013
Quartal:
4. Quartal
Jahr / Monat:
2013-10
Monat:
Oct
Seiten:
1131 - 1134
Print-ISBN:
13999669
Sprache:
en
WWW:
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6686861
 BibTeX