Testchip for high temperature superconductor passive devices

Dill, R.; Otto, J.; Riha, G.; Russer, P.; Schultz, L.; Solkner, G.; Valenzuela, A. A.; Wolfgang, E.

doi:10.1109/MWSYM.1990.99684

dill_testchip_1990

Title:: Testchip for high temperature superconductor passive devices
Document type:: Konferenzbeitrag
Author(s):: Dill, R.; Otto, J.; Riha, G.; Russer, P.; Schultz, L.; Solkner, G.; Valenzuela, A. A.; Wolfgang, E.
Abstract:: A testchip for fully characterizing high-temperature-superconducting (HTS) thin-film properties relevant to planar passive microwave device applications is presented. The chip integrates coplanar resonators and transmission lines along with structures for process monitoring. Measurements of the quality factor of coplanar resonators as a function of temperature and input power are reported. For the coupling of the resonators to the input signals, microwave probes with 40-GHz bandwidth have been used within the cryo-environment. Quality values obtained at 5 GHz and 77 K are superior to that of an equivalent copper resonator by a factor of about 40 «
A testchip for fully characterizing high-temperature-superconducting (HTS) thin-film properties relevant to planar passive microwave device applications is presented. The chip integrates coplanar resonators and transmission lines along with structures for process monitoring. Measurements of the quality factor of coplanar resonators as a function of temperature and input power are reported. For the coupling of the resonators to the input signals, microwave probes with 40-GHz bandwidth have been u... »
Keywords:: superconducting devices, transmission lines, resonators, 40 GHz, quality factor, solid-state microwave devices, 77 K, high-temperature superconductors, superconducting thin films, strip line components, temperature, process monitoring, high temperature superconductor, 5 GHz, test equipment, coplanar resonators, electron device testing, input power, microwave probes, planar passive microwave device applications, testchip, thin-film properties
Book / Congress title:: Microwave Symposium Digest, 1990., IEEE MTT-S International
Year:: 1990
Pages:: 863--866 vol.2
Fulltext / DOI:: doi:10.1109/MWSYM.1990.99684
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mediaTUM Gesamtbestand Einrichtungen Hochschulpräsidium TUM Senior Excellence Faculty

mediaTUM Gesamtbestand Einrichtungen Schools TUM School of Computation, Information and Technology Departments Electrical Engineering Computational Photonics (Prof. Jirauschek)Peter Russer