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Title:

Stochastic EMI sources localization based on ultra wide band near-field measurements

Document type:
Konferenzbeitrag
Author(s):
Baev, A.; Gorbunova, A.; Konovalyuk, M.; Kuznetsov, Y.; Russer, J.
Abstract:
A localization technique for stochastic EMI sources based on time domain measurements of EM near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The main limitations for scanning parameters are discussed. The case study for a frequency and spatial localizations of equivalent point sources is presented based on the modeling and me...     »
Book / Congress title:
European Microwave Conference (EuMC), 1131--1134 (2013)
Congress (additional information):
Nuremberg, Germany, Oct 06 - 10, 2013
Publisher:
IEEE Xplore Digital Library
Year:
2013
Quarter:
4. Quartal
Year / month:
2013-10
Month:
Oct
Pages:
1131 - 1134
Print-ISBN:
13999669
Language:
en
WWW:
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6686861
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