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Document type:
Konferenzbeitrag
Author(s):
Ludwig, Matthias and Hepp, Alexander and Brunner, Michaela and Baehr, Johanna
Title:
CRESS: Framework for Vulnerability Assessment of Attack Scenarios in Hardware Reverse Engineering
Abstract:
rust and security of microelectronic systems are a major driver for game-changing trends like autonomous driving or the internet of things. These trends are endangered by threats like soft- and hardware attacks or IP tampering – wherein often hardware reverse engineering (RE) is involved for efficient attack planning. The constant publication of new RE-related scenarios and countermeasures renders a profound rating of these extremely difficult. Researchers and practitioners have no tools...     »
Keywords:
hardware reverse engineering (RE), security framework, vulnerability assessment, countermeasures, threat analysis, case study, IC trust
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE)
Congress (additional information):
Washington DC, US
Year:
2021
Quarter:
4. Quartal
Year / month:
2021-11
Month:
Nov
Pages:
1-8
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1109/PAINE54418.2021.9707695
WWW:
https://ieeexplore-ieee-org.eaccess.ub.tum.de/document/9707695
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