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Ziemys, G.; Ahrens, V.; Mendisch, S.; Csaba, G.; Becherer, M.
Speeding up nanomagnetic logic by DMI enhanced Pt/Co/Ir films
AIP Advances 8, 056310 (2018) 2018-01
2018
Jan
Ziemys, G.; Csaba, G.; Becherer, M.
On the discrimination between nucleation and propagation in nanomagnetic logic devices
AIP Advances 8, 056003 (2018) 2018-01
2018
Jan
Bückle, M.; Hauber, V.C.; Cole, G.D.; Gärtner, C.; Zeimer, U.; Grenzer, J.; Weig, E.M.
Stress control of tensile-strained In1−xGaxP nanomechanical string resonators
Appl. Phys. Lett. 113, 201903 (2018) 2018-10
2018
Oct
La Torraca, P.; Ricci, Y.; Albrecht, A.; Bobinger, M.; Pavan, P.; Cattani, L.; Becherer, M.; Lugli, P.; Larcher, L.
Printed Technology Solutions for Audio Transducers
2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO)
Cork, Ireland, 23-26 July 2018 2018-07
IEEE Xplore Digital Library
2018
Becherer, M.; Mendisch, S.; Ziemys, G.
Compact Modeling of Nanomagnetic Logic Devices and Circuits
MOS-AK workshop Munich
2018
Becherer, M.
Magnetic computation: visions from a fabricational perspective
DANTE-18: In-Memory Computing: Emerging devices, architectures, and applications
2018
Russer, J.A.
Stochastic Electromagnetic Fields
COST IC 1407 Training School
Valletta, Malta, 19-20 Apr 2018
2018
Haider, M.; Baev, A.; Kuznetsov, Y.; Russer, J.A.
Near-Field to Far-Field Propagation of Correlation Information for Noisy Electromagnetic Fields
2018 48th European Microwave Conference (EuMC)
Madrid, Spain, 23-27 Sep 2018 2018-09
IEEE Xplore Digital Library
2018
Bajon, D.; Kuznetsov, Y.; Wane, S.; Thomas, D.W.P.; Russer, J.A.; Russer, P.
Toward Standard Near-Field Measurement Solutions for Stochastic Electromagnetic Fields
2018 IEEE Conference on Antenna Measurements & Applications (CAMA)
Vasteras, Sweden, 03-06 Sep 2018 2018-09
IEEE Xplore Digital Library
2018
Russer, J.A.; Haider, M.; Russer, P.
Time-Domain Modeling of Noisy Electromagnetic Field Propagation
IEEE Transactions on Microwave Theory and Techniques ( Volume: 66 , Issue: 12 , Dec. 2018 ) 2018-12
2018
Dec
5415-5428
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