- Author(s):
- Hommel, S.; Killat, N.; Altes, A.; Schweinboeck, T.; Schmitt-Landsiedel, D.; Silvestri, M.; Haeberlen, O.
- Title:
- {S}canning {M}icrowave {M}icroscopy for {E}lectronic {D}evice {A}nalysis on {N}anometre {S}cale
- Journal title:
- Microelectronics Reliability
- Year:
- 2016
- Journal volume:
- 64
- Month:
- sep
- Fulltext / DOI:
- doi:10.1016/j.microrel.2016.07.134
- BibTeX