Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package (LNA}-Probe Co-Design

Wane, S.; Bajon, D.; Lesenechal, D.; Russer, J.A.; Thomas, D.; Russer, P.

Dokumenttyp:: Konferenzbeitrag
Autor(en):: Wane, S.; Bajon, D.; Lesenechal, D.; Russer, J.A.; Thomas, D.; Russer, P.
Titel:: Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package (LNA}-Probe Co-Design
Kongress- / Buchtitel:: Proc. European Microwave Conference (EuMC) 2016-10
Kongress / Zusatzinformationen:: London, United Kingdom, 03-07 Oct 2016
Jahr:: 2016
Quartal:: 4. Quartal
Jahr / Monat:: 2016-10
Monat:: Oct
Reviewed:: ja
Sprache:: en
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